Integrated Circuits Test: Active Devices

The course reviews test characterization methods for active integrated photonics components, including photodetectors (by Prof. Juejun Hu from MIT), modulators (by Prof. Jelena Notaros from MIT), light sources (by Prof. Jifeng Liu from Dartmouth College), full photonic links (by Prof. Jaime Cardenas from the University of Rochester).

The course will also include extensive lab demo videos from MIT on modulator measurements, Bridgewater State University (by Prof. Samuel Serna) on light source characterization, and the AIM Photonics Test, Assembly, and Packaging (TAP) facility in Rochester to visualize different device characterization techniques for digital and analog photonic links.