AIM Photonics to Present Integrated Photonics R&D at Photonics West 2024
Join us as experts from AIM Photonics will share a selection of the Institute’s recent technology advancements in silicon photonics at the SPIE Photonics West conference to be held Jan. 27–Feb. 1, 2024 in San Francisco, California.
In addition to the highlighted talks below, be sure to visit us at our booth (#241) for a live demonstration of passive insertion loss measurements on a AIM Photonics-manufactured photonic integrated circuit featuring components from the APSUNY component library in AIM Photonics’ PDK.
Members of our technical staff will also be available at our exhibit booth throughout the conference to explain how AIM Photonics can help advance your company’s innovative ideas into manufacturing-ready prototypes using our design enablement, multi-project wafer and electronic-photonic test, assembly and packaging services.
Register online for the conference and mark your calendars now to find out more about how AIM Photonics is continuing to advance the U.S. silicon photonics manufacturing ecosystem.
A Vertical-Junction Carrier-Injection Micro-Ring Modulator Fabricated in AIM Photonics’ Quantum FLEX Platform
Mohammad Rakib Uddin
Research and Development Engineer, AIM Photonics
In this presentation, Dr. M. Rakib Uddin will demonstrate a vertical-junction, carrier-injection, micro-ring modulator device fabricated in AIM Photonics’ 300 mm Quantum FLEX Platform. Uddin will show how the modulator is designed to achieve both electrical and optical modulation characteristics and how the modulator is tested. The results show a vertical junction with excellent direct current (DC) I-V characteristics and modulator performance with a high modulation efficiency of ~1.14 nm and a large ON-OFF ratio of ~21 dB at 1.0 V.
Tuesday, January 30 | 2:40-3:00 PM (PST)
Automated Measurement Flow for PDK Development in a 300 mm Silicon Photonics Foundry
Javery Mann
Electrical and Optical Test and Measurement Engineer, AIM Photonics
As silicon photonics-based circuit designs make a transition from lab to fab, an end-to-end automated measurement flow is required to address a unique combination of high volume and high flexibility in test conditions. In this poster presentation, Javery Mann illustrates such a flow for AIM Photonics’ process design kit (PDK) development in NYCREATES’ state-of-the-art 300 mm CMOS-compatible silicon photonics foundry located at the Albany NanoTech Complex. Mann will explain the stages of automated measurement flow, from the layout stage to electro-optic measurements performed across the wafer.
Wednesday, January 31 | 6:00-8:00 PM (PST)